Understanding Exposure and Deviation Indices from msc scheme Watch Video
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⏲ Duration: 15 min 64 sec ✓ Published: 03-Oct-2013
Description: 2011 Joint AAPM/COMP MeetingnMr. David L Leong, MSc, Analogic Corporation, Peabody, MA, 1960, United StatesnFor more information about the American Association of Physicists in Medicine, visit http://www.aapm.org/nnAs digital radiography systems began to be developed, manufacturers independently developed methods and terminology to express an exposure to their detectors. With each manufacturer having a different scheme, users quickly became confused when moving between equipment. The Interna
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